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RECERCAT Home > Universitat de Barcelona > Física Fonamental > Articles publicats en revistes (Física Fonamental) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/10915

Title: Size effect on current fluctuations in thin metal films: Monte Carlo approach
Author: Bulashenko, O. M.; Kochelap, O. V.; Kochelap, V. A.(Viacheslav Aleksandrovich)
Other authors: Universitat de Barcelona
Publication date: 2010-05-04
Subject(s): Pel·lícules metàl·liques
Mètode de Montecarlo
Metallic films
Monte Carlo method
Rights: (c) The American Physical Society, 1992
Document type: Article
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Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach (Publication date: 2012-03-02)
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