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Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization
Sancho i Parramon, Jordi; Ferré Borrull, Josep; Bosch i Puig, Salvador; Ferrara, Maria Christina
Universitat de Barcelona
2012-07-13
Òptica electrònica
Electron optics
(c) Optical Society of America, 2003
Article
Optical Society of America
         

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