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Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
Duparré, Angela; Ferré Borrull, Josep; Gliech, Stefan; Notni, Gunther; Steinert, Jörg; Bennett, Jean M.
Universitat de Barcelona
2012-07-13
Òptica electrònica
Electron optics
(c) Optical Society of America, 2001
Article
Optical Society of America
         

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