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Coherence estimation in synthetic aperture radar data based on speckle noise modeling
López Martínez, Carlos; Pottier, Eric
Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció
In the past we proposed a multidimensional speckle noise model to which we now include systematic phase variation effects. This extension makes it possible to define what is believed to be a novel coherence model able to identify the different sources of bias when coherence is estimated on multidimensionalsynthetic radar aperture (SAR) data. On the one hand, low coherence biases are basically due to the complex additive speckle noise component of the Hermitian product of two SAR images. On the other hand, the availability of the coherence model permits us to quantify the bias due to topography when multilook filtering is considered, permitting us to establish the conditions upon which information may be estimated independently of topography. Based on the coherence model, two coherence estimation approaches, aiming to reduce the different biases, are proposed. Results with simulated and experimental polarimetric and interferometric SAR data illustrate and validate both, the coherence model and the coherence estimation algorithms.
Peer reviewed
2012-05-11
Àrees temàtiques de la UPC::Enginyeria electrònica i telecomunicacions::Radiocomunicació i exploració electromagnètica::Teledetecció
Speckle
Interferometry
Polarimetry
Synthetic aperture radar
Speckle
Interferometry
Polarimetry
Synthetic aperture radar data
Light interferometry
Remote sensing by radar
Coherence estimation
Synthetic aperture radar
Speckle noise modeling
Multidimensional speckle noise model
Phase variation effects
Complex additive speckle noise component
Hermitian product
Multilook filtering
Coherence model
Polarització (Electricitat)
Interferometria
Radar d'obertura sintètica
Consulteu les condicions d'ús d'aquest document en el repositori original:http://hdl.handle.net/2117/1454
Article
Optical Society of America
         

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