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Modifications in the Si valence band after ion-beam-induced oxidation
Alay, Josep Lluís; Vandervorst, Wilfried
Universitat de Barcelona
2012-05-08
Semiconductors
Propietats òptiques
Oxidació
Química de superfícies
Impacte
Semiconductors
Optical properties
Oxidation
Surface chemistry
Impact
(c) American Institute of Physics 1994
Article
American Institute of Physics
         

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