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Electrically active point defects in n-type 4H¿SiC
Doyle, J. P.; Linnarsson, M. K.; Pellegrino, Paolo; Keskitalo, N.; Svensson, B. G.; Schoner, A.; Nordell, N.; Lindstrom, J. L.
Universitat de Barcelona
2012-05-03
Estructura electrònica
Cristal·lografia
Electronic structure
Crystallography
(c) American Institute of Physics, 1998
Article
American Institute of Physics
         

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