To access the full text documents, please follow this link: http://hdl.handle.net/2445/24724

Analysis by optical absorption and transmission electron microscopy of the strain inhomogeneities in InGaAs/InP strained layers
Roura Grabulosa, Pere; Clark, S. A.; Bosch Estrada, José; Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
Universitat de Barcelona
2012-05-02
Propietats òptiques
Optical properties
(c) American Institute of Physics, 1995
Article
American Institute of Physics
         

Show full item record

Related documents

Other documents of the same author

Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon; Clark, S. A.; Williams, R. H.
Peiró Martínez, Francisca; Cornet i Calveras, Albert; Herms Berenguer, Atilà; Morante i Lleonart, Joan Ramon; Clark, S. A.; Williams, R. H.
Roura Grabulosa, Pere; Vilà i Arbonès, Anna Maria; Bosch Estrada, José; López de Miguel, Manuel; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon; Westwood, David I.
Clark, S. A.; Roura Grabulosa, Pere; Bosch Estrada, José; Pérez Rodríguez, Alejandro; Morante i Lleonart, Joan Ramon; Westwood, David I.; Williams, R. H.
Roura Grabulosa, Pere; López de Miguel, Manuel; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
 

Coordination

 

Supporters