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RECERCAT Home > Universitat de Barcelona > Electrònica > Articles publicats en revistes (Electrònica) > View document

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Title:	Effect of stress and composition on the Raman spectra of etch-stop SiGeB layers
Author:	Pérez Rodríguez, Alejandro; Romano Rodríguez, Alberto; Cabezas, R.; Morante i Lleonart, Joan Ramon; Jawhari Colin, Tariq; Hunt, Charles E.
Other authors:	Universitat de Barcelona
Publication date:	2012-05-02
Subject(s):	Espectroscòpia Raman Raman spectroscopy Raman effect Efecte Raman
Rights:	(c) American Institute of Physics, 1996
Document type:	Article
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