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Spectroscopic characterization of phases formed by high-dose carbon ion implantation in silicon
Serre, Christophe; Pérez Rodríguez, Alejandro; Romano Rodríguez, Alberto; Morante i Lleonart, Joan Ramon; Kögler, R.; Skorupa, Wolfgang
Universitat de Barcelona
2012-05-02
Cristal·lografia
Espectroscòpia
Crystallography
Spectrum analysis
(c) American Institute of Physics, 1995
Article
American Institute of Physics
         

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